The Suib Group at the University of Connecticut collaborated with Hiden Analytical to determine the effectiveness of Hiden’s Compact SIMS (Secondary Ion Mass Spectroscopy) Analysis System for various research applications, including:
- Surface Contamination on Silver Electrodes
- Catalyst Dopant Homogeneity
- Carbon Contamination and Removal via heat treatment
- Urethane Tubing Chemical Attack
For the detailed experiment findings, click here.


