The Bruker Nano ContourX platform has set the benchmark for accuracy and repeatability. From better than 0.1% repeatability on a NIST traceable step height standard to better than 0.03 nm repeatability on a super-smooth SiC mirror, ContourX delivers gage-capable metrology for utmost confidence in your application needs.

The ContourX suite of benchtop profilometers feature industry-leading measurement hardware and analysis advances to provide gage-capable, quantitative 3D surface characterization for an extremely wide range of surfaces, from rough to smooth, bright to dark, transparent to opaque or otherwise difficult to measure. With the available choice of configurations, analytical options, objectives, and measurement modes, ContourX is tailored to meet the needs of virtually any challenging surface metrology application.