Bruker Nano Dektak XTL
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The Bruker Nano Dektak XTL™ stylus profilometer accommodates samples up to 350mm x 350mm, bringing legendary Dektak® repeatability and reproducibility to large-format wafer and panel manufacturing. The Dektak XTL features pneumatic vibration isolation and a fully enclosed workstation with easily accessible interlocking door, making it ideal for today’s demanding production floor environments. Its dual-camera architecture enables enhanced spatial awareness, and its high level of automation maximizes manufacturing throughput.
PERFORMANCE & SPECIFICATIONS
- Benefits
- Enhanced software features make the Dektak XTL the most powerful, easiest to use stylus profiler available
- The system utilizes Vision64 software that enables unlimited measurement sites, 3D mapping, and highly customized characterization with hundreds of built-in analysis tools
- Vision Microform software also measures shapes, such as radius of curvature. Pattern recognition minimizes operator error and enhances measurement location accuracy
- The all-in-one software package combines data collection and analysis with an intuitive workflow
- Technical Sheet: