Hiden Analytical ToF-qSIMS Workstation
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The Hiden TOF-qSIMS system is designed for surface analysis and depth profiling applications of a wide range of materials including polymers, pharmaceuticals, superconductors, semiconductors, alloys, optical and functional coatings and dielectrics, with measurement of trace components to sub-ppm levels.
PERFORMANCE & SPECIFICATIONS
- Benefits
- Sensitive static SIMS analysis for top monolayer specificity
- High mass range detects large molecules from polymers, pharmaceuticals, forensics
- High mass resolution separates molecular interferences
- Parallel detection allows a posteriori analysis of unknowns
- Hyperspectral imaging and depth profiling for rapid determination of spatial distributions
- High dynamic range and abundance sensitivity depth profiling
- Fully flexible and future-proof SIMS instrument
- Technical Sheet: