Bruker Optic Silicon Ingot Analyzer: SiBrickScan
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SiBrickScan (SBS) is a dedicated at-line system for the FT-IR quantification of interstitial Oxygen in complete Silicon ingots, resulting in a concentration profile along the longitudinal axis. Accessing this information without sawing wafers or test samples is a major and cost saving advantage.
PERFORMANCE & SPECIFICATIONS
- Benefits
- Highest sensitivity by state-of-the-art FTIR spectroscopy
- Get valuable information to check and optimize product quality
- Dedicated SBS versions for different ingot types
- Industry compatible and robust design
- Intuitive and easy to use software interface
- Innovative high sensitivity beam path with included reference sample
- Detector options according to customer requirements