Bruker Nano ContourX-500
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The Bruker Optic ContourX-500 Optical Profilometer is the world’s most comprehensive automated benchtop system for fast, non-contact 3D surface metrology. The gage-capable ContourX-500 boasts unmatched Z-axis resolution and accuracy, and provides all of the industry-recognized advantages of Bruker’s white light interferometry (WLI) floor-standing models in a much smaller footprint. The profiler is easily customized for the widest range of complex applications, from QA/QC metrology of precision machined surfaces and semiconductor processes to R&D characterization for ophthalmics and MEMS devices.
PERFORMANCE & SPECIFICATIONS
- Benefits
- Tip/tilt optical head which measures surface features over a range of angles while minimizing tracking errors
- Most advanced user interface providing intuitive access to an extensive library of pre-programmed filters and analyses
- Integrated air isolaion providing the best metrology precision in a space-efficient footprint
- Applications:
- Precision engineering
- MEMS and Sensors
- Semiconductors
- Technical Sheet: