Bruker Nano ContourX-200
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The Bruker Optic ContourX-200 Optical Profilometer provides the perfect blend of advanced characterization, customizable options, and ease of use for best-in-class fast, accurate, and repeatable non-contact 3D surface metrology. The gage-capable, small footprint system offers uncompromised 2D/3D high-resolution measurement capabilities using a larger FOV 5 MP digital camera and new motorized XY stage. Boasting unmatched Z-axis resolution and accuracy, the ContourX-200 provides all the industry recognized advantages of Bruker’s proprietary white light interferometry (WLI) technology without the limitations of conventional confocal microscopes and competing standard optical profilers.
PERFORMANCE & SPECIFICATIONS
- Benefits
- Automation capabilities that enable routines for faster measurements and analysis
- Motorized XY stage providing low-noise, high-speed operation for quantitative metrology
- Vibration-tolerant compact design which delivers measurement stability and gage-capable repeatability
- Applications:
- Precision Engineering
- MEMS and Sensors
- Semiconductors
- Technical Sheet: