Bruker Nano ContourX-100
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The ContourX-100 Optical Profilometer sets a new benchmark for accurate and repeatable non-contact surface metrology at a best-in-class price point. The small footprint system offers uncompromised 2D/3D high-resolution measurement capabilities in a streamlined package that incorporates decades of proprietary Bruker white light interferometry (WLI) innovation. Next-generation enhancements include a new 5 MP camera and updated stage for larger stitching capabilities, and a new measurement mode, USI, for even greater convenience and flexibility for precision machined surfaces, thick films, and tribology applications. You will not find a benchtop system with better value than the ContourX-100.
PERFORMANCE & SPECIFICATIONS
- Benefits
- The ContourX-100 profiler is the culmination of over four decades of proprietary optical innovation and industry leadership in non-contact surface metrology, characterization, and imaging
- ContourX-100 is robust in all surface situations from 0.05% to 100% reflectivity
- Bruker’s simple and powerful VisionXpress™ and Vision64® user interfaces, the ContourX-100 benchtop is optimized for productivity in both labs and on factory floors
- Applications:
- Precision Engineering
- MEMS and Sensors
- Semiconductors
- Technical Sheet: