Bruker Nano ContourGT-X

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The Bruker Optic ContourGT-X 3D Optical Profiler provides the highest performing non-contact surface measurements for laboratory research and production process control. Incorporating ten generations of white light interferometry (WLI) innovation and design, this metrology system delivers the highest vertical resolution over the industry’s largest field of view. Key features include full automation and a production interface, a large motorized XYZ stage, tip/tilt in the head, and an integral air isolation table. Designed from the ground up for the most demanding R&D, quality assurance, and process quality control needs, the ContourGT-X offers the ultimate in gage-capable 3D optical accuracy and robustness.

PERFORMANCE & SPECIFICATIONS

  • Benefits
    • Full automation providing fast, and easy nanometer-scale measurements 
    • Customizable production interface delivering a streamline process workflow, with automated mapping and load measurement recipes
    • Self-calibrating laser reference ensuring the best metrology production, and robustness 
      • Technical Sheet:
        • ContourGT-X