Bruker Nano Contour Elite X
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The Bruker Optic Contour Elite X 3D Optical Profiler combines unmatched measurement capabilities with highest vertical resolution over the industry’s largest field of view and high-fidelity color or monochrome imaging. No other metrology system provides the non-contact accuracy, throughput, operator convenience, and imaging capabilities to address such a vast range of production metrology applications. Designed from the ground up for the most demanding R&D, quality assurance, and process quality control needs, the Contour Elite X offers the ultimate gage-capable 3D optical profiling solution.
PERFORMANCE & SPECIFICATIONS
- Benefits
- Reliable optical measurements to make informed, and quantifiable R&D and QA/QC decisions
- True-color imaging that reveals previously hiden microscopic details
- Flexible staging and fixturing that tailors metrology to your specific sample and application
- Technical Sheet:
Contour Elite X